High-Speed Overlay Measurement Equipment Dig DigInfo - (http//moviediginfotv)
Omron exhibited its High Speed CD/Overlay Measurement Equipment at Finetech Japan 2008 This technology is intended to be used by manufacturers to inspect the wiring of LCD array substrates and the line width and layer deviation of transistors
The new equipment make Tags : computerelectronicsmechanicsHighSpeedOverlayDigInfoOmron Visto : 209 video subido por Diginfonews .